Micron 1c DRAM node found in latest smartphone teardown and die analysis
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Micron 1c DRAM node found in latest smartphone teardown and die analysis

Thursday, April 2, 2026 at 01:39 PM

A die analysis of Micron 1c DRAM reveals its implementation in high-end smartphones, indicating successful mass production and deployment of the 1c node.

Context

Recent die analysis and smartphone teardowns have confirmed the presence of Micron's 1c (1-gamma) DRAM node in cutting-edge mobile devices. This sixth-generation 10nm-class memory represents a major technological milestone, following Micron's earlier announcements in February 2025 regarding the sampling of its 1-gamma node. The company is the first in the industry to reach this node in a consumer device, utilizing advanced EUV lithography and next-generation high-K metal gate (HKMG) technology to achieve a 30% increase in bit density over the previous 1-beta generation. This development is critical for the Edge AI market, as the 16Gb chips offer a 15% speed increase up to 9200MT/s and a 20% reduction in power consumption. For investors, Micron's successful deployment in flagship smartphones signals a competitive lead over South Korean rivals Samsung and SK Hynix in the 1c race. The company aims to have these sixth-generation products account for more than 50% of its total DRAM bit shipments by the second half of 2026.

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